Microelectronics failure analysis : desk reference

• Corporate Authors: ASM International, Electronic Device Failure Analysis Society
• Other Authors: Ross, Richard J.
• Format: Electronic eBook
• Language: English
• Published: Materials Park, Ohio : ASM International, ©2011.
• Edition: 6th ed.
• Subjects: Microelectronics > Materials > Testing > Handbooks, manuals, etc.; Microelectronics > Defects > Testing > Handbooks, manuals, etc.; Electronic apparatus and appliances > Testing > Handbooks, manuals, etc.; Electronics > Materials > Testing > Handbooks, manuals, etc.; Electronics > Materials > Defects > Handbooks, manuals, etc.; Electronics > Materials > Handbooks, manuals, etc.; elektronické knihy; electronic books
• ISBN: 9781613447598; 1613447590; 9781615037261; 1615037268; 161503725X; 9781615037254
• Physical Description: 1 online resource (xi, 660 pages) : illustrations
• Item Description: "ASM International, 2011, no. 09110Z"--Page 4 of cover; Some online versions lack accompanying media packaged with the printed version.
• Access: Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty