ISTFA 2010 : conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA

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Bibliographic Details
Corporate Authors: International Symposium for Testing and Failure Analysis Dallas, Tex.), ASM International., Electronic Device Failure Analysis Society.
Format: eBook
Language: English
Published: Materials Park, Ohio : ASM International, 2010.
Subjects:
Electronics > Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
elektronické knihy
electronic books
ISBN: 9781615037278
1615037276
9781680155105
1680155105
9780615030418
9781615030415
0615030416
Physical Description: 1 online resource (xix, 464 pages) : color illustrations

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Table of contents

Description
Bibliography: Includes bibliographical references and index.
ISBN: 9781615037278
1615037276
9781680155105
1680155105
9780615030418
9781615030415
0615030416
Access: Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty

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