Reliability and radiation effects in compound semiconductors

• Main Author: Johnston, Allan
• Format: eBook
• Language: English
• Published: Singapore ; Hackensack, NJ : World Scientific, ©2010.
• Subjects: Compound semiconductors > Reliability.; Compound semiconductors > Effect of radiation on.; elektronické knihy; electronic books
• ISBN: 9781615836871; 161583687X; 9789814277112; 9814277118; 981427710X; 9789814277105
• Physical Description: 1 online resource (xii, 363 pages) : illustrations

This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first...