Reliability and radiation effects in compound semiconductors
This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first...
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| Main Author | |
|---|---|
| Format | Electronic eBook |
| Language | English |
| Published |
Singapore ; Hackensack, NJ :
World Scientific,
©2010.
|
| Subjects | |
| Online Access | Full text |
| ISBN | 9781615836871 161583687X 9789814277112 9814277118 981427710X 9789814277105 |
| Physical Description | 1 online resource (xii, 363 pages) : illustrations |
Glossary of Terms