Measurement technology and intelligent instruments IX : selected papers of the 9th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2009), June 29-July 2, 2009, Saint-Petersburg, Russia

This special collection focuses on measurement science and metrology: micro- and nano- measurements; novel measurement methods and diagnostic technologies, including non-destructive and dimensional inspection, optical and X-ray tomography and interferometry, terahertz technologies for science, indus...

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Bibliographic Details
Corporate Author International Symposium on Measurement Technology and Intelligent Instruments Saint Petersburg, Russia
Other Authors Chugui, Yuri V.
Format Electronic eBook
LanguageEnglish
Published Stafa-Zuerich ; Enfield, NH : Trans Tech Publications, ©2010.
SeriesKey engineering materials ; v. 437.
Subjects
Online AccessFull text
ISBN9781613447161
1613447167
9783038133551
3038133558
0878492739
9780878492732
ISSN1013-9826 ;
Physical Description1 online resource (xx, 656 pages) : illustrations

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