System-on-chip test architectures : nanometer design for testability

• Other Authors: Wang, Laung-Terng., Stroud, Charles E., Touba, Nur A.
• Format: eBook
• Language: English
• Published: Amsterdam ; Boston : Morgan Kaufmann Publishers, ©2008.
• Series: Morgan Kaufmann series in systems on silicon.
• Subjects: Systems on a chip > Testing.; Integrated circuits > Very large scale integration > Testing.; Integrated circuits > Very large scale integration > Design.; elektronické knihy; electronic books
• ISBN: 9780123739735; 012373973X; 9780080556802; 0080556809; 1281100048; 9781281100047; 9786611100049; 6611100040
• Physical Description: 1 online resource (xxxvi, 856 pages) : illustrations

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semic...