Properties of amorphous silicon and its alloys

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Bibliographic Details
Corporate Author INSPEC (Information service)
Other Authors Searle, Tim, Dr
Format Electronic eBook
LanguageEnglish
Published London : INSPEC, IEE, ©1998.
SeriesEMIS datareviews series ; no. 19.
Subjects
Silicon.
Silicon alloys.
Amorphous semiconductors.
elektronické knihy
electronic books
Online AccessFull text
ISBN0852969228
9780852969229
1591248760
9781591248767
Physical Description1 online resource (xiv, 412 pages) : illustrations

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Bibliography:Includes bibliographical references and index.
ISBN:0852969228
9780852969229
1591248760
9781591248767
Access:Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty
Physical Description:1 online resource (xiv, 412 pages) : illustrations

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