Electronics reliability and measurement technology : nondestructive evaluation

This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.

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Bibliographic Details
Other Authors: Heyman, Joseph S.
Format: eBook
Language: English
Published: Park Ridge, N.J., U.S.A. : Noyes Data Corp., ©1988.
Subjects:
Integrated circuits > Reliability > Congresses.
Nondestructive testing > Congresses.
Integrated circuits > Testing > Congresses.
elektronické knihy
electronic books
ISBN: 1591240514
9781591240518
9780815511717
081551171X
9780815516996
0815516991
9780080944685
008094468X
1282002295
9781282002296
9786612002298
6612002298
0815517009
9780815517009
Physical Description: 1 online resource (xii, 128 pages) : illustrations

Cover

Table of contents

Description
Summary: This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.
Item Description: "The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--Page vii
Bibliography: Includes bibliographical references and index.
ISBN: 1591240514
9781591240518
9780815511717
081551171X
9780815516996
0815516991
9780080944685
008094468X
1282002295
9781282002296
9786612002298
6612002298
0815517009
9780815517009
Access: Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty

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