Knowledge-driven board-level functional fault diagnosis

• Main Authors: Ye, Fangming (Author), Zhang, Zhaobo (Author), Chakrabarty, Krishnendu (Author), Gu, Xinli (Author)
• Format: Electronic eBook
• Language: English
• Published: Switzerland : Springer, [2016]
• Subjects: Fault location (Engineering); Fault tolerance (Engineering); elektronické knihy; electronic books
• ISBN: 9783319402109; 9783319402093
• Physical Description: 1 online resource (xiii, 147 pages) : illustrations (some color)

This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to...