Failure analysis of integrated circuits : tools and techniques

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Bibliographic Details
Main Author	Wagner, Lawrence C. (Author)
Format	Book
Language	English
Published	New York : Springer Science+Business Media, LLC, 1999
Edition	1st edition
Subjects	integrované obvody polovodiče testování elektronických systémů spolehlivost (technika) integrated circuits semiconductors testing of electronic systems reliability (engineering) příručky handbooks and manuals
ISBN	9781461372318
Physical Description	ix, 255 stran : černobílé ilustrace ; 24 cm

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Holdings details from Knihovna UTB
Status	More Information	Location	Call Number
Status Long term loan – Due: 21.12.2028	More Information	Location FAI	Call Number 621.3/FAILURE

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