Holdings: Failure analysis of integrated circuits :

Failure analysis of integrated circuits : tools and techniques

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Bibliographic Details
Main Author:	Wagner, Lawrence C. (Author)
Format:	Book
Language:	English
Published:	New York : Springer Science+Business Media, LLC, 1999
Edition:	1st edition
Subjects:	integrované obvody polovodiče testování elektronických systémů spolehlivost (technika) integrated circuits semiconductors testing of electronic systems reliability (engineering) příručky handbooks and manuals
ISBN:	9781461372318
Physical Description:	ix, 255 stran : černobílé ilustrace ; 24 cm

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Status	Description	Location	Call Number
Status Long term loan – Due : 21.12.2028 Recall This	Description Location	FAI	Call Number	621.3/FAILURE

Status	Description	Location	Call Number
Long term loan - Due : 21.12.2028 Recall This		FAI	621.3/FAILURE