Description: Scanning electron microscopy :

Scanning electron microscopy : physics of image formation and microanalysis

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Bibliographic Details
Main Author:	Reimer, Ludwig, 1928-2001 (Author)
Format:	Book
Language:	English
Published:	Berlin : Springer, [2010]
Edition:	Second completly revised and updated edition
Series:	Springer series in optical sciences
Subjects:	skenovací elektronová mikroskopie scanning electron microscopy monografie monographs
ISBN:	9783642083723
Physical Description:	xiv, 527 stran : ilustrace ; 24 cm

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Item Description:	Popsáno podle dotisku
Bibliography:	Obsahuje bibliografii a rejstřík
ISBN:	9783642083723
ISSN:	0342-4111 ;