Holdings: Fundamentals of atomic force microscopy

Fundamentals of atomic force microscopy

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Bibliographic Details
Main Author:	Reifenberger, Ronald G. (Author)
Format:	Book
Language:	English
Published:	New Jersey ; London ; Singapore ; Beijing ; Shanghai ; Hong Kong ; Taipei ; Chennai ; Tokyo : World Scientific, [2016]-
Series:	Lessons from nanoscience
Subjects:	atomová spektroskopie atomic spectroscopy učební texty educational texts
ISBN:	9789814630344 978-981-4630-35-1
Physical Description:	^^^svazků : ilustrace ; 23 cm

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Status	Description	Location	Call Number
Status Long term loan – Due : 22.12.2026 Recall This	Description Part 1 Location	CPS	Call Number	543/REIFENBERGER,R.

Status	Description	Location	Call Number
Long term loan - Due : 22.12.2026 Recall This	Part 1	CPS	543/REIFENBERGER,R.