Measurement technology and intelligent instruments IX selected papers of the 9th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2009), June 29-July 2, 2009, Saint-Petersburg, Russia

This special collection focuses on measurement science and metrology: micro- and nano- measurements; novel measurement methods and diagnostic technologies, including non-destructive and dimensional inspection, optical and X-ray tomography and interferometry, terahertz technologies for science, indus...

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Bibliographic Details
Corporate Author: International Symposium on Measurement Technology and Intelligent Instruments Saint Petersburg, Russia)
Other Authors: Chugui, Yuri V.
Format: eBook
Language: English
Published: Stafa-Zuerich ; Enfield, NH : Trans Tech Publications, c2010.
Series: Key engineering materials ; v. 437.
Subjects:
Engineering instruments > Congresses.
Measuring instruments > Congresses.
elektronické knihy
electronic books
ISBN: 9781613447161
9780878492732
9783038133551
Physical Description: 1 online zdroj (xx, 656 p.) : ill.

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008 101019s2010 sz a sb 101 0 eng d
020 |a 9781613447161  |q (ebook) 
020 |z 9780878492732 
020 |a 9783038133551 
035 |a (OCoLC)670512376  |z (OCoLC)673506389  |z (OCoLC)769460978 
040 |a MUU  |b eng  |c MUU  |d CUS  |d OCLCQ  |d KNOVL  |d E7B  |d OCLCQ  |d KNOVL  |d OCLCO  |d EBLCP  |d KNOVL  |d DEBSZ  |d OCLCO  |d CUY  |d OCLCF  |d OCLCO 
111 2 |a International Symposium on Measurement Technology and Intelligent Instruments  |n (9th :  |d 2009 :  |c Saint Petersburg, Russia) 
245 1 0 |a Measurement technology and intelligent instruments IX  |h [elektronický zdroj] :  |b selected papers of the 9th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2009), June 29-July 2, 2009, Saint-Petersburg, Russia /  |c edited by Yuri Chugui ... [et al.]. 
246 3 0 |a 9th International Symposium on Measurement Technology and Intelligent Instruments 
246 3 |a Ninth International Symposium on Measurement Technology and Intelligent Instruments 
246 3 0 |a International Symposium on Measurement Technology and Intelligent Instruments 
246 3 0 |a ISMTII-2009 
260 |a Stafa-Zuerich ;  |a Enfield, NH :  |b Trans Tech Publications,  |c c2010. 
300 |a 1 online zdroj (xx, 656 p.) :  |b ill. 
490 1 |a Key engineering materials,  |x 1013-9826 ;  |v v. 437 
504 |a Includes bibliographical references and index. 
520 |a This special collection focuses on measurement science and metrology: micro- and nano- measurements; novel measurement methods and diagnostic technologies, including non-destructive and dimensional inspection, optical and X-ray tomography and interferometry, terahertz technologies for science, industry and biomedicine, intelligent measuring instruments and systems for industry and transport, measurements of geometrical and mechanical quantities, measurements and metrology for humanitarian fields and education in measurement science. The aim was to present the current state and evolution of measuring technology and intelligent instruments, to highlight novel technologies for science, industry and engineering, and to spot promising ways towards further development, of new technologies for measurement, at the international level. 
590 |a Knovel Library  |b ACADEMIC - Manufacturing Engineering 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity 
650 0 |a Engineering instruments  |v Congresses. 
650 0 |a Measuring instruments  |v Congresses. 
655 7 |a elektronické knihy  |7 fd186907  |2 czenas 
655 9 |a electronic books  |2 eczenas 
700 1 |a Chugui, Yuri V. 
776 0 8 |i Print version:  |a International Symposium on Measurement Technology and Intelligent Instruments (9th : 2009 : Saint Petersburg, Russia).  |t Measurement technology and intelligent instruments IX.  |d Stafa-Zuerich ; Enfield, NH : Trans Tech Publications Ltd., c2010  |z 0878492739  |w (OCoLC)650791268 
830 0 |a Key engineering materials ;  |v v. 437. 
856 4 0 |u https://proxy.k.utb.cz/login?url=http://app.knovel.com/hotlink/toc/id:kpMTIIIX07/measurement_technology_and_intelligent_instruments_ix  |y Plný text 
992 |a BK  |c KNOVEL 
999 |c 80408  |d 80408 
993 |x NEPOSILAT  |y EIZ 

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