Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach

Saved in:
Bibliographic Details
Corporate Author: Institution of Engineering and Technology.
Other Authors: Sun, Yichuang. (Editor)
Format: eBook
Language: English
Published: London : Institution of Engineering and Technology, 2008.
Series: IET circuits, devices and systems series ; 19.
Subjects:
Linear integrated circuits > Testing.
Mixed signal circuits > Testing.
Radio frequency integrated circuits > Testing.
elektronické knihy
electronic books
ISBN: 9780863419997
9780863417450
9781615833153
Physical Description: 1 online zdroj (xx, 389 pages) : illustrations.

Cover

Table of contents

LEADER 02282cam a2200433 a 4500
001 78924
003 CZ ZlUTB
005 20200530181203.0
006 m o d
007 cr |n
008 081106s2008 enka sb 001 0 eng d
020 |a 9780863419997  |q (ebook) 
020 |z 9780863417450 
020 |a 9781615833153  |q (ebook) 
035 |a (OCoLC)456124034  |z (OCoLC)424642044  |z (OCoLC)623468726  |z (OCoLC)646795920  |z (OCoLC)712981930 
040 |a CtWfDGI  |b eng  |e pn  |c QE2  |d IWA  |d N$T  |d YDXCP  |d OCLCQ  |d IDEBK  |d E7B  |d OCLCQ  |d B24X7  |d EBLCP  |d OCLCO  |d OCLCQ  |d CUS  |d OCLCQ  |d KNOVL  |d GZM  |d DEBSZ  |d ZCU  |d KNOVL 
245 0 0 |a Test and diagnosis of analogue, mixed-signal and RF integrated circuits  |h [elektronický zdroj] :  |b the system on chip approach /  |c edited by Yichuang Sun. 
260 |a London :  |b Institution of Engineering and Technology,  |c 2008. 
300 |a 1 online zdroj (xx, 389 pages) :  |b illustrations. 
336 |a text  |b txt  |2 rdacontent 
337 |a počítač  |b c  |2 rdamedia 
338 |a online zdroj  |b cr  |2 rdacarrier 
490 1 |a Circuits, devices and systems series ;  |v 19 
500 |a Title from title screen. 
504 |a Includes bibliographical references and index. 
590 |a Knovel Library  |b ACADEMIC - Electronics & Semiconductors 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity 
650 0 |a Linear integrated circuits  |x Testing. 
650 0 |a Mixed signal circuits  |x Testing. 
650 0 |a Radio frequency integrated circuits  |x Testing. 
655 7 |a elektronické knihy  |7 fd186907  |2 czenas 
655 9 |a electronic books  |2 eczenas 
700 1 |a Sun, Yichuang.  |4 edt 
710 2 |a Institution of Engineering and Technology. 
776 0 8 |i Print version:  |t Test and diagnosis of analogue, mixed-signal and RF integrated circuits.  |d London : Institution of Engineering and Technology, 2008  |z 9780863417450  |w (OCoLC)180473599 
830 0 |a IET circuits, devices and systems series ;  |v 19. 
856 4 0 |u https://proxy.k.utb.cz/login?url=http://app.knovel.com/hotlink/toc/id:kpTDAMSRF1/test_and_diagnosis_of_analogue_mixedsignal_and_rf_integrated_circuits__the_system_on_chip_approach  |y Plný text 
992 |a BK  |c KNOVEL 
999 |c 78924  |d 78924 

Similar Items