Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach
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| Corporate Author | |
|---|---|
| Other Authors | |
| Format | Electronic eBook |
| Language | English |
| Published |
London :
Institution of Engineering and Technology,
2008.
|
| Series | IET circuits, devices and systems series ;
19. |
| Subjects | |
| Online Access | Full text |
| ISBN | 9780863419997 9780863417450 9781615833153 |
| Physical Description | 1 online zdroj (xx, 389 pages) : illustrations. |
Cover
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| 245 | 0 | 0 | |a Test and diagnosis of analogue, mixed-signal and RF integrated circuits |h [elektronický zdroj] : |b the system on chip approach / |c edited by Yichuang Sun. |
| 260 | |a London : |b Institution of Engineering and Technology, |c 2008. | ||
| 300 | |a 1 online zdroj (xx, 389 pages) : |b illustrations. | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a počítač |b c |2 rdamedia | ||
| 338 | |a online zdroj |b cr |2 rdacarrier | ||
| 490 | 1 | |a Circuits, devices and systems series ; |v 19 | |
| 500 | |a Title from title screen. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 590 | |a Knovel Library |b ACADEMIC - Electronics & Semiconductors | ||
| 506 | |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity | ||
| 650 | 0 | |a Linear integrated circuits |x Testing. | |
| 650 | 0 | |a Mixed signal circuits |x Testing. | |
| 650 | 0 | |a Radio frequency integrated circuits |x Testing. | |
| 655 | 7 | |a elektronické knihy |7 fd186907 |2 czenas | |
| 655 | 9 | |a electronic books |2 eczenas | |
| 700 | 1 | |a Sun, Yichuang. |4 edt | |
| 710 | 2 | |a Institution of Engineering and Technology. | |
| 776 | 0 | 8 | |i Print version: |t Test and diagnosis of analogue, mixed-signal and RF integrated circuits. |d London : Institution of Engineering and Technology, 2008 |z 9780863417450 |w (OCoLC)180473599 |
| 830 | 0 | |a IET circuits, devices and systems series ; |v 19. | |
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