Description: Test and diagnosis of analogue, mixed-signal and RF integrated circuits

Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach

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Bibliographic Details
Corporate Author:	Institution of Engineering and Technology.
Other Authors:	Sun, Yichuang. (Editor)
Format:	eBook
Language:	English
Published:	London : Institution of Engineering and Technology, 2008.
Series:	IET circuits, devices and systems series ; 19.
Subjects:	Linear integrated circuits > Testing. Mixed signal circuits > Testing. Radio frequency integrated circuits > Testing. elektronické knihy electronic books
ISBN:	9780863419997 9780863417450 9781615833153
Physical Description:	1 online zdroj (xx, 389 pages) : illustrations.

Description
Item Description:	Title from title screen.
Bibliography:	Includes bibliographical references and index.
ISBN:	9780863419997 9780863417450 9781615833153
Access:	Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity