Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach

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Bibliographic Details
Corporate Author Institution of Engineering and Technology
Other Authors Sun, Yichuang (Editor)
Format Electronic eBook
LanguageEnglish
Published London : Institution of Engineering and Technology, 2008.
SeriesIET circuits, devices and systems series ; 19.
Subjects
Linear integrated circuits > Testing.
Mixed signal circuits > Testing.
Radio frequency integrated circuits > Testing.
elektronické knihy
electronic books
Online AccessFull text
ISBN9780863419997
9780863417450
9781615833153
Physical Description1 online zdroj (xx, 389 pages) : illustrations.

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Item Description:Title from title screen.
Bibliography:Includes bibliographical references and index.
ISBN:9780863419997
9780863417450
9781615833153
Access:Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity
Physical Description:1 online zdroj (xx, 389 pages) : illustrations.

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