Description: Electronics reliability and measurement technology

Electronics reliability and measurement technology nondestructive evaluation

This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.

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Bibliographic Details
Other Authors:	Heyman, Joseph S.
Format:	eBook
Language:	English
Published:	Park Ridge, N.J., U.S.A. : Noyes Data Corp., ©1988.
Subjects:	Integrated circuits > Reliability > Congresses. Nondestructive testing > Congresses. Integrated circuits > Testing > Congresses. elektronické knihy electronic books
ISBN:	9781591240518 9780815511717 9780815516996 9780815517009 9780080944685
Physical Description:	1 online zdroj (xii, 128 pages) : illustrations

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Description
Summary:	This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.
Item Description:	"The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--Page vii.
Bibliography:	Includes bibliographical references and index.
ISBN:	9781591240518 9780815511717 9780815516996 9780815517009 9780080944685
Access:	Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity