Electronics reliability and measurement technology nondestructive evaluation

This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.

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Bibliographic Details
Other Authors Heyman, Joseph S.
Format Electronic eBook
LanguageEnglish
Published Park Ridge, N.J., U.S.A. : Noyes Data Corp., ©1988.
Subjects
Integrated circuits > Reliability > Congresses.
Nondestructive testing > Congresses.
Integrated circuits > Testing > Congresses.
elektronické knihy
electronic books
Online AccessFull text
ISBN9781591240518
9780815511717
9780815516996
9780815517009
9780080944685
Physical Description1 online zdroj (xii, 128 pages) : illustrations

Cover

More Information
Summary:This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.
Item Description:"The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--Page vii.
Bibliography:Includes bibliographical references and index.
ISBN:9781591240518
9780815511717
9780815516996
9780815517009
9780080944685
Access:Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity
Physical Description:1 online zdroj (xii, 128 pages) : illustrations

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