Characterization of semiconductor materials principles and methods
Includes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, and Ion/Solid Interactions.
Saved in:
Other Authors: | |
---|---|
Format: | eBook |
Language: | English |
Published: |
Park Ridge, N.J. :
Noyes Publications,
©1989-
|
Series: | Materials science and process technology series.
|
Subjects: | |
ISBN: | 9781591240273 9780815516347 9780815512004 |
Physical Description: | 1 online zdroj (volumes <1>) : illustrations. |
Online Access:
Online Resources