System-on-chip test architectures nanometer design for testability

• Other Authors: Wang, Laung-Terng.
• Format: eBook
• Language: English
• Published: Amsterdam : Elsevier, 2007.
• Series: Systems on silicon
• Subjects: Systems on a chip > Testing.; Integrated circuits > Very large scale integration > Testing.; Integrated circuits > Very large scale integration > Design.; elektronické knihy; electronic books
• ISBN: 9780123739735
• Physical Description: 1 online zdroj.