An introduction to mixed-signal IC test and measurement

"With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topic...

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Bibliographic Details
Main Author: Roberts, Gordon W., 1959-
Other Authors: Taenzler, Friedrich., Burns, Mark, 1962-
Format: eBook
Language: English
Published: New York : Oxford University Press, c2012.
Edition: 2nd ed.
Series: Oxford series in electrical and computer engineering.
Subjects:
Integrated circuits > Testing.
Mixed signal circuits > Testing.
elektronické knihy
electronic books
ISBN: 9781613449486
9780199796212
Physical Description: 1 online zdroj (xxv, 836 p.) : ill.

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Table of contents

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007 cr |n
008 120801s2012 nyua sb 001 0 eng d
020 |a 9781613449486  |q (ebook) 
020 |z 9780199796212 
035 |a (OCoLC)802809251 
040 |a KNOVL  |c KNOVL  |d DEBSZ  |d ZCU  |d OCLCQ  |d KNOVL  |d OCLCO  |d KNOVL 
100 1 |a Roberts, Gordon W.,  |d 1959- 
245 1 3 |a An introduction to mixed-signal IC test and measurement  |h [elektronický zdroj] /  |c Gordon Roberts, Friedrich Taenzler, Mark Burns. 
250 |a 2nd ed. 
260 |a New York :  |b Oxford University Press,  |c c2012. 
300 |a 1 online zdroj (xxv, 836 p.) :  |b ill. 
490 1 |a The Oxford series in electrical and computer engineering 
500 |a Burns' name appears first on the previous edition. 
504 |a Includes bibliographical references and index. 
505 0 |a Overview of mixed-signal testing -- Tester hardware -- DC and parametric measurements -- Data analysis and probability theory -- Yield, measurement accuracy, and test time -- DAC testing -- ADC testing -- Sampling theory -- DSP-based testing -- Analog channel testing -- Sampled channel testing -- Fundamentals of RF testing -- RF test methods -- Clock and serial data communications channel measurements -- Tester interfacing--DIB design -- Design for test (DfT). 
520 |a "With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topics will help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples, exercises and problems"--Provided by publisher. 
590 |a Knovel Library  |b ACADEMIC - Computer Hardware Engineering 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity 
650 0 |a Integrated circuits  |x Testing. 
650 0 |a Mixed signal circuits  |x Testing. 
655 7 |a elektronické knihy  |7 fd186907  |2 czenas 
655 9 |a electronic books  |2 eczenas 
700 1 |a Taenzler, Friedrich. 
700 1 |a Burns, Mark,  |d 1962- 
776 0 8 |i Print version:  |a Roberts, Gordon W., 1959-  |t Introduction to mixed-signal IC test and measurement.  |b 2nd ed.  |d New York : Oxford University Press, c2012  |z 9780199796212  |w (DLC) 2011031312  |w (OCoLC)774691433 
830 0 |a Oxford series in electrical and computer engineering. 
856 4 0 |u https://proxy.k.utb.cz/login?url=http://app.knovel.com/hotlink/toc/id:kpIMSICTM4/introduction_to_mixedsignal_ic_test_and_measurement_2nd_edition  |y Plný text 
992 |a BK  |c KNOVEL 
999 |c 78220  |d 78220 
993 |x NEPOSILAT  |y EIZ 

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