An introduction to mixed-signal IC test and measurement
"With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topic...
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| Main Author | |
|---|---|
| Other Authors | , |
| Format | eBook |
| Language | English |
| Published |
New York :
Oxford University Press,
c2012.
|
| Edition | 2nd ed. |
| Series | Oxford series in electrical and computer engineering.
|
| Subjects | |
| Online Access | Full text |
| ISBN | 9781613449486 9780199796212 |
| Physical Description | 1 online zdroj (xxv, 836 p.) : ill. |
Cover
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| 100 | 1 | |a Roberts, Gordon W., |d 1959- | |
| 245 | 1 | 3 | |a An introduction to mixed-signal IC test and measurement |h [elektronický zdroj] / |c Gordon Roberts, Friedrich Taenzler, Mark Burns. |
| 250 | |a 2nd ed. | ||
| 260 | |a New York : |b Oxford University Press, |c c2012. | ||
| 300 | |a 1 online zdroj (xxv, 836 p.) : |b ill. | ||
| 490 | 1 | |a The Oxford series in electrical and computer engineering | |
| 500 | |a Burns' name appears first on the previous edition. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | |a Overview of mixed-signal testing -- Tester hardware -- DC and parametric measurements -- Data analysis and probability theory -- Yield, measurement accuracy, and test time -- DAC testing -- ADC testing -- Sampling theory -- DSP-based testing -- Analog channel testing -- Sampled channel testing -- Fundamentals of RF testing -- RF test methods -- Clock and serial data communications channel measurements -- Tester interfacing--DIB design -- Design for test (DfT). | |
| 520 | |a "With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topics will help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples, exercises and problems"--Provided by publisher. | ||
| 590 | |a Knovel Library |b ACADEMIC - Computer Hardware Engineering | ||
| 506 | |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity | ||
| 650 | 0 | |a Integrated circuits |x Testing. | |
| 650 | 0 | |a Mixed signal circuits |x Testing. | |
| 655 | 7 | |a elektronické knihy |7 fd186907 |2 czenas | |
| 655 | 9 | |a electronic books |2 eczenas | |
| 700 | 1 | |a Taenzler, Friedrich. | |
| 700 | 1 | |a Burns, Mark, |d 1962- | |
| 776 | 0 | 8 | |i Print version: |a Roberts, Gordon W., 1959- |t Introduction to mixed-signal IC test and measurement. |b 2nd ed. |d New York : Oxford University Press, c2012 |z 9780199796212 |w (DLC) 2011031312 |w (OCoLC)774691433 |
| 830 | 0 | |a Oxford series in electrical and computer engineering. | |
| 856 | 4 | 0 | |u https://proxy.k.utb.cz/login?url=http://app.knovel.com/hotlink/toc/id:kpIMSICTM4/introduction_to_mixedsignal_ic_test_and_measurement_2nd_edition |
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