An introduction to mixed-signal IC test and measurement
"With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topic...
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Main Author: | |
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Other Authors: | , |
Format: | eBook |
Language: | English |
Published: |
New York :
Oxford University Press,
c2012.
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Edition: | 2nd ed. |
Series: | Oxford series in electrical and computer engineering.
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Subjects: | |
ISBN: | 9781613449486 9780199796212 |
Physical Description: | 1 online zdroj (xxv, 836 p.) : ill. |
Summary: | "With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topics will help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples, exercises and problems"--Provided by publisher. |
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Item Description: | Burns' name appears first on the previous edition. |
Bibliography: | Includes bibliographical references and index. |
ISBN: | 9781613449486 9780199796212 |
Access: | Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity |