An introduction to mixed-signal IC test and measurement

"With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topic...

Full description

Saved in:
Bibliographic Details
Main Author: Roberts, Gordon W., 1959-
Other Authors: Taenzler, Friedrich., Burns, Mark, 1962-
Format: eBook
Language: English
Published: New York : Oxford University Press, c2012.
Edition: 2nd ed.
Series: Oxford series in electrical and computer engineering.
Subjects:
ISBN: 9781613449486
9780199796212
Physical Description: 1 online zdroj (xxv, 836 p.) : ill.

Cover

Table of contents

Description
Summary: "With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topics will help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples, exercises and problems"--Provided by publisher.
Item Description: Burns' name appears first on the previous edition.
Bibliography: Includes bibliographical references and index.
ISBN: 9781613449486
9780199796212
Access: Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity