Atomic force microscopy in process engineering introduction to AFM for improved processes and products

Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process en...

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Bibliographic Details
Other Authors Bowen, W. Richard, Hilal, Nidal
Format Electronic eBook
LanguageEnglish
Published Oxford ; Burlington, MA : Butterworth-Heinemann, ©2009.
Edition1st ed.
SeriesButterworth-Heinemann/IChemE series.
Subjects
Atomic force microscopy.
Production engineering.
elektronické knihy
electronic books
Online AccessFull text
ISBN9780080949574
9781856175173
Physical Description1 online zdroj (xvi, 283 pages) : illustrations.

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Table of Contents:
  • BASIC PRINCIPLES OF ATOMIC FORCE MICROSCOPY / W Richard Bowen, Nidal Hilal and Daniel Johnson
  • CHARACTERISATION OF MEMBRANE SURFACES / W Richard Bowen, Nidal Hilal and Teodora Doneva
  • AFM AND DEVELOPMENT OF (BIO)FOULING RESISTANT MEMBRANES / W Richard Bowen, Nidal Hilal, Huabing Yin and Laila Al-Khatib
  • APPLICATION OF ATOMIC FORCE MICROSCOPY TO PARTICLE-PARTICLE INTERACTIONS / Nidal Hilal, Yuncheng Liang and Daniel Johnson
  • QUANTIFICATION OF PARTICLE-BUBBLE INTERACTIONS / Nidal Hilal and Daniel Johnson
  • NANOSCALE ANALYSIS OF PHARMACEUTICALS BY SCANNING PROBE MICROSCOPY / Clive J Roberts
  • THE APPLICATION OF AFM WITHIN BIOPROCESS ENGINEERING / Chris J Wright
  • THE APPLICATION OF AFM TO THE DEVELOPMENT OF PROCESS PLANT MATERIALS / Chris J Wright
  • ATOMIC FORCE MICROSCOPY AND POLYMERS ON SURFACES / Vasileios Koutsos
  • AFM-BASED MICRO/NANO-RHEOMETRY / Matthew S Barrow and P Rhodri Williams
  • CONCLUSIONS AND FUTURE OUTLOOK / W Richard Bowen and Nidal Hilal.

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