Atomic force microscopy in process engineering introduction to AFM for improved processes and products

Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process en...

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Bibliographic Details
Other Authors: Bowen, W. Richard., Hilal, Nidal.
Format: eBook
Language: English
Published: Oxford ; Burlington, MA : Butterworth-Heinemann, ©2009.
Edition: 1st ed.
Series: Butterworth-Heinemann/IChemE series.
Subjects:
Atomic force microscopy.
Production engineering.
elektronické knihy
electronic books
ISBN: 9780080949574
9781856175173
Physical Description: 1 online zdroj (xvi, 283 pages) : illustrations.

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245 0 0 |a Atomic force microscopy in process engineering  |h [elektronický zdroj] :  |b introduction to AFM for improved processes and products /  |c [edited by] W. Richard Bowen and Nidal Hilal. 
250 |a 1st ed. 
260 |a Oxford ;  |a Burlington, MA :  |b Butterworth-Heinemann,  |c ©2009. 
300 |a 1 online zdroj (xvi, 283 pages) :  |b illustrations. 
336 |a text  |b txt  |2 rdacontent 
337 |a počítač  |b c  |2 rdamedia 
338 |a online zdroj  |b cr  |2 rdacarrier 
490 1 |a Butterworth-Heinemann/IChemE series 
504 |a Includes bibliographical references and index. 
505 0 |a BASIC PRINCIPLES OF ATOMIC FORCE MICROSCOPY / W Richard Bowen, Nidal Hilal and Daniel Johnson -- CHARACTERISATION OF MEMBRANE SURFACES / W Richard Bowen, Nidal Hilal and Teodora Doneva -- AFM AND DEVELOPMENT OF (BIO)FOULING RESISTANT MEMBRANES / W Richard Bowen, Nidal Hilal, Huabing Yin and Laila Al-Khatib -- APPLICATION OF ATOMIC FORCE MICROSCOPY TO PARTICLE-PARTICLE INTERACTIONS / Nidal Hilal, Yuncheng Liang and Daniel Johnson -- QUANTIFICATION OF PARTICLE-BUBBLE INTERACTIONS / Nidal Hilal and Daniel Johnson -- NANOSCALE ANALYSIS OF PHARMACEUTICALS BY SCANNING PROBE MICROSCOPY / Clive J Roberts -- THE APPLICATION OF AFM WITHIN BIOPROCESS ENGINEERING / Chris J Wright -- THE APPLICATION OF AFM TO THE DEVELOPMENT OF PROCESS PLANT MATERIALS / Chris J Wright -- ATOMIC FORCE MICROSCOPY AND POLYMERS ON SURFACES / Vasileios Koutsos -- AFM-BASED MICRO/NANO-RHEOMETRY / Matthew S Barrow and P Rhodri Williams -- CONCLUSIONS AND FUTURE OUTLOOK / W Richard Bowen and Nidal Hilal. 
520 |a Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process engineers and scientists, where AFM investigations are leading directly to improved processes and products. This is the first book to bring together both the basic theory and proven process engineering practice of AFM, and to present them in a way that is accessible and valuable to practising engineers, those who are improving their AFM skills and knowledge, and researchers who are developing new products and solutions using AFM. The book takes a rigorous but practical approach to ensure that it is also directly applicable to practical process engineering problems. Fundamentals of the techniques are concisely described and specific benefits for process engineering clearly defined and illustrated. Coverage of applications of AFM to important areas of process engineering is comprehensive. Each of the chapter authors are recognized authorities on their subject. 
590 |a Knovel Library  |b ACADEMIC - Chemistry & Chemical Engineering 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity 
650 0 |a Atomic force microscopy. 
650 0 |a Production engineering. 
655 7 |a elektronické knihy  |7 fd186907  |2 czenas 
655 9 |a electronic books  |2 eczenas 
700 1 |a Bowen, W. Richard. 
700 1 |a Hilal, Nidal. 
776 0 8 |i Print version:  |t Atomic force microscopy in process engineering.  |b 1st ed.  |d Oxford ; Burlington, MA : Butterworth-Heinemann, ©2009  |z 9781856175173  |w (OCoLC)311788904 
830 0 |a Butterworth-Heinemann/IChemE series. 
856 4 0 |u https://proxy.k.utb.cz/login?url=http://app.knovel.com/hotlink/toc/id:kpAFMPEAI2/atomic_force_microscopy_in_process_engineering__an_introduction_to_afm_for_improved_processes_and_products  |y Plný text 
992 |a BK  |c KNOVEL 
999 |c 77447  |d 77447 

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