Reliability and radiation effects in compound semiconductors

This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first...

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Bibliographic Details
Main Author Johnston, Allan
Format eBook
LanguageEnglish
Published Singapore ; Hackensack, NJ : World Scientific, c2010.
Subjects
Online AccessFull text
ISBN9781615836871
Physical Description1 online zdroj (xii, 363 p.) : ill.

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