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Atomic force microscopy : exploring basic modes and advanced applications

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Bibliographic Details
Main Author Haugstad, Greg, 1963- (Author)
Corporate Author John Wiley & Sons
Format Electronic eBook
LanguageEnglish
Published Hoboken. : Wiley, [2012]
Subjects
mikroskopie atomárních sil
atomic force microscopy
monografie
elektronické knihy
monographs
electronic books
Online AccessFull text
ISBN9781118360668
978-0-470-63882-8
Physical Description1 online zdroj (xxii, 464 stran) : ilustrace

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