Lab VIEW run four point probe device : electrical characterization of semiconducting thin films made easy by four point probe system controlled by LabVIEW

• Main Authors: Agumba, John (Author), Karimi, Patrick (Author), Okumu, John (Author)
• Format: Book
• Language: English
• Published: Saarbrücken : LAP LAMBERT Academic Publishing, c2012
• Subjects: fyzika tenkých vrstev; tenké vrstvy; polovodiče; elektrická vodivost; elektrické vlastnosti materiálů; zkoušení materiálů; automatizované měřicí systémy; physics of thin layers; thin films; semiconductors; electric conductivity; electric properties of materials; material testing; automated measuring systems; LabView; studie; studies
• ISBN: 9783659134821
• Physical Description: xix, 116 s. : il. ; 23 cm
• Item Description: Terminologický slovník