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|a Atomic force microscopy in process engineering :
|b an introduction to AFM for improved processes and products /
|c [edited by] W. Richard Bowen and Nidal Hilal
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|a 1st ed.
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260 |
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|a Oxford :
|b Butterworth-Heinemann,
|c 2009
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300 |
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|a xvi, 283 s. :
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|c 24 cm
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504 |
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|a Obsahuje bibliografie a rejstřík
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650 |
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|a atomic force microscopy
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650 |
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|a scanning probe microscopy
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650 |
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|a microscopic examination of materials
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655 |
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655 |
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|a collective monographs
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|a Bowen, W. Richard
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