Atomic force microscopy in process engineering : an introduction to AFM for improved processes and products

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Bibliographic Details
Other Authors Bowen, W. Richard (Editor), Hilal, Nidal (Editor)
Format Book
LanguageEnglish
Published Oxford : Butterworth-Heinemann, 2009
Edition1st ed.
SeriesButterworth-Heinemann/IChemE series
Subjects
mikroskopie atomárních sil
skenovací mikroskopie
mikroskopické zkoumání materiálů
atomic force microscopy
scanning probe microscopy
microscopic examination of materials
kolektivní monografie
collective monographs
ISBN9781856175173
Physical Descriptionxvi, 283 s. : il. ; 24 cm

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Bibliography:Obsahuje bibliografie a rejstřík
ISBN:9781856175173
Physical Description:xvi, 283 s. : il. ; 24 cm

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