Atomic force microscopy in process engineering : an introduction to AFM for improved processes and products

• Other Authors: Bowen, W. Richard (Editor), Hilal, Nidal (Editor)
• Format: Book
• Language: English
• Published: Oxford : Butterworth-Heinemann, 2009
• Edition: 1st ed.
• Series: Butterworth-Heinemann/IChemE series
• Subjects: mikroskopie atomárních sil; skenovací mikroskopie; mikroskopické zkoumání materiálů; atomic force microscopy; scanning probe microscopy; microscopic examination of materials; kolektivní monografie; collective monographs
• ISBN: 9781856175173
• Physical Description: xvi, 283 s. : il. ; 24 cm