Description: Atomic force microscopy :

Atomic force microscopy : understanding basic modes and advanced applications

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Bibliographic Details
Main Author:	Haugstad, Greg, 1963- (Author)
Format:	Book
Language:	English
Published:	Hoboken, N.J. : John Wiley & Sons, c2012
Subjects:	mikroskopie atomárních sil atomic force microscopy monografie monographs
ISBN:	9780470638828
Physical Description:	xxii, 464 s. : il. ; 25 cm

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Bibliography:	Obsahuje bibliografie a rejstřík
ISBN:	9780470638828