Atomic force microscopy : understanding basic modes and advanced applications

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Bibliographic Details
Main Author Haugstad, Greg, 1963- (Author)
Format Book
LanguageEnglish
Published Hoboken, N.J. : John Wiley & Sons, c2012
Subjects
mikroskopie atomárních sil
atomic force microscopy
monografie
monographs
Online AccessAnotace
Biografické informace
Obsah
ISBN9780470638828
Physical Descriptionxxii, 464 s. : il. ; 25 cm

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Bibliography:Obsahuje bibliografie a rejstřík
ISBN:9780470638828
Physical Description:xxii, 464 s. : il. ; 25 cm

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