Lifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications

• Main Author: Rein, Stefan (Author)
• Format: Book
• Language: English
• Published: Berlin ; Heidelberg ; New York : Springer, [2005]
• Series: Springer series in materials science
• Subjects: spektroskopie; polovodiče; fotovoltaika; silikony; elektronová spektroskopie; technická diagnostika; spectroscopic analysis; semiconductors; photovoltaics; silicones; electron spectroscopy; technical diagnostics; monografie; monographs
• ISBN: 3540253033 978-3-540-25303-7
• ISSN: 0933-033X ;
• Physical Description: xxvi, 489 stran : ilustrace ; 25 cm