Scanning electron microscopy and X-ray microanalysis

• Main Author: Goldstein, Joseph, 1939- (Author)
• Format: Book
• Language: English
• Published: New York : Springer, 2003
• Edition: 3rd ed.
• Subjects: skenovací elektronová mikroskopie; elektronová mikroanalýza; rentgenová spektroskopie; scanning electron microscopy; electron probe microanalysis; X-ray spectroscopy; monografie; monographs
• ISBN: 0306472929 978-0-306-47292-3
• Physical Description: xix, 690 s., [6] s. obr. příl. : il. ; 26 cm + 1 CD-ROM