Structural and Chemical Analysis of Materials : X-ray, electron and neutron diffraction. X-ray, electron and ion spectrometry. Electron microscopy

• Main Author: Eberhart, Jean-Pierre (Author)
• Format: Book
• Language: English
• Published: Chichester : John Wiley & Sons, 1995
• Subjects: chemická analýza; difrakce; elektronová mikroskopie; elektrony; ionty; materiály; neutrony; rentgenová difrakce; rentgenová spektroskopie; spektrometrie; struktura
• ISBN: 0471950149
• Physical Description: 545 s.