Advanced Transmission Electron Microscopy : Imaging and Diffraction in Nanoscience
This volume expands and updates the coverage in the authors' classic 1992 book, "Electron Microdiffraction." As the title implies, the focus of the book has changed from electron microdiffraction, or convergent beam electron diffraction, to electron nanodiffraction and the application...
Saved in:
Main Authors: | , |
---|---|
Corporate Author: | |
Format: | eBook |
Language: | English |
Published: |
New York, NY :
Springer New York : Imprint: Springer,
2017.
|
Subjects: | |
ISBN: | 9781493966073 |
Physical Description: | 1 online resource (XXVI, 729 p. 310 illus., 218 illus. in color.) |
LEADER | 02902nam a22005535i 4500 | ||
---|---|---|---|
001 | 100676 | ||
003 | CZ-ZlUTB | ||
005 | 20240914113014.0 | ||
006 | m o d | ||
007 | cr nn 008mamaa | ||
008 | 161026s2017 xxu| fo |||| 0|eng d | ||
999 | |c 100676 |d 100676 | ||
020 | |a 9781493966073 | ||
024 | 7 | |a 10.1007/978-1-4939-6607-3 |2 doi | |
072 | 7 | |a 620.1/.2 |x Nauka o materiálu |2 Konspekt |9 19 | |
080 | |a 537.533.35 |2 MRF | ||
080 | |a 620.2-024-022.532 |2 MRF | ||
080 | |a 62-022.532 |2 MRF | ||
080 | |a 544.1-022.532 |2 MRF | ||
080 | |a (0.034.2:08) |2 MRF | ||
080 | |a (048.8) |2 MRF | ||
100 | 1 | |a Zuo, Jian Min. |e author. | |
245 | 1 | 0 | |a Advanced Transmission Electron Microscopy : |b Imaging and Diffraction in Nanoscience / |c by Jian Min Zuo, John C.H. Spence. |
264 | 1 | |a New York, NY : |b Springer New York : |b Imprint: Springer, |c 2017. | |
300 | |a 1 online resource (XXVI, 729 p. 310 illus., 218 illus. in color.) | ||
336 | |a text |b txt |2 rdacontent | ||
337 | |a počítač |b c |2 rdamedia | ||
338 | |a online zdroj |b cr |2 rdacarrier | ||
506 | |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty | ||
520 | |a This volume expands and updates the coverage in the authors' classic 1992 book, "Electron Microdiffraction." As the title implies, the focus of the book has changed from electron microdiffraction, or convergent beam electron diffraction, to electron nanodiffraction and the applications of electron diffraction from single crystals as well as general structure analysis of single crystals, powders, and nanostructures. Advanced Transmission Electron Microscopy provides a comprehensive treatment of theory and practice, and is written at a level suitable for advanced undergraduate students and graduate students and researchers in materials science, chemistry, and physics. Practical guides are provided for interpretation and simulation of electron diffraction patterns.- Resumé vydavatel | ||
650 | 0 | 7 | |a transmisní elektronová mikroskopie |2 czenas |7 ph563328 |
650 | 0 | 7 | |a nanostruktury |2 czenas |7 ph451017 |
650 | 0 | 7 | |a nanotechnologie |2 czenas |7 ph123164 |
650 | 0 | 7 | |a nanochemie |2 czenas |7 ph502994 |
650 | 0 | 9 | |a transmission electron microscopy |2 eczenas |
650 | 0 | 9 | |a nanostructures |2 eczenas |
650 | 0 | 9 | |a nanotechnology |2 eczenas |
650 | 0 | 9 | |a nanochemistry |2 eczenas |
655 | 7 | |a elektronické knihy |7 fd186907 |2 czenas | |
655 | 7 | |a monografie |7 fd132842 |2 czenas | |
655 | 9 | |a electronic books |2 eczenas | |
655 | 9 | |a monographs |2 eczenas | |
700 | 1 | |a Spence, John C.H. |e author. | |
710 | 2 | |a SpringerLink (Online service) | |
776 | 0 | 8 | |i Printed edition: |z 9781493966059 |
856 | 4 | 0 | |u https://proxy.k.utb.cz/login?url=http://dx.doi.org/10.1007/978-1-4939-6607-3 |y Plný text |
942 | |2 udc | ||
992 | |c NTK-SpringerCHEMS | ||
993 | |x NEPOSILAT |y EIZ |