Advanced Transmission Electron Microscopy : Imaging and Diffraction in Nanoscience

This volume expands and updates the coverage in the authors' classic 1992 book, "Electron Microdiffraction." As the title implies, the focus of the book has changed from electron microdiffraction, or convergent beam electron diffraction, to electron nanodiffraction and the application...

Full description

Saved in:
Bibliographic Details
Main Authors: Zuo, Jian Min. (Author), Spence, John C.H. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language: English
Published: New York, NY : Springer New York : Imprint: Springer, 2017.
Subjects:
transmisní elektronová mikroskopie
nanostruktury
nanotechnologie
nanochemie
transmission electron microscopy
nanostructures
nanotechnology
nanochemistry
elektronické knihy
monografie
electronic books
monographs
ISBN: 9781493966073
Physical Description: 1 online resource (XXVI, 729 p. 310 illus., 218 illus. in color.)

Cover

Table of contents

LEADER 02871nam a22005415i 4500
001 100676
003 CZ-ZlUTB
005 20210426130231.0
006 m o d
007 cr nn 008mamaa
008 161026s2017 xxu| fo |||| 0|eng d
999 |c 100676  |d 100676 
020 |a 9781493966073 
024 7 |a 10.1007/978-1-4939-6607-3  |2 doi 
072 7 |a 620.1/.2  |x Nauka o materiálu  |2 Konspekt  |9 19 
080 |a 537.533.35  |2 MRF 
080 |a 620.2-024-022.532  |2 MRF 
080 |a 62-022.532  |2 MRF 
080 |a 544.1-022.532  |2 MRF 
080 |a (0.034.2:08)  |2 MRF 
080 |a (048.8)  |2 MRF 
100 1 |a Zuo, Jian Min.  |e author. 
245 1 0 |a Advanced Transmission Electron Microscopy :  |b Imaging and Diffraction in Nanoscience /  |c by Jian Min Zuo, John C.H. Spence. 
264 1 |a New York, NY :  |b Springer New York :  |b Imprint: Springer,  |c 2017. 
300 |a 1 online resource (XXVI, 729 p. 310 illus., 218 illus. in color.) 
336 |a text  |b txt  |2 rdacontent 
337 |a počítač  |b c  |2 rdamedia 
338 |a online zdroj  |b cr  |2 rdacarrier 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty 
520 |a This volume expands and updates the coverage in the authors' classic 1992 book, "Electron Microdiffraction." As the title implies, the focus of the book has changed from electron microdiffraction, or convergent beam electron diffraction, to electron nanodiffraction and the applications of electron diffraction from single crystals as well as general structure analysis of single crystals, powders, and nanostructures. Advanced Transmission Electron Microscopy provides a comprehensive treatment of theory and practice, and is written at a level suitable for advanced undergraduate students and graduate students and researchers in materials science, chemistry, and physics. Practical guides are provided for interpretation and simulation of electron diffraction patterns.- Resumé vydavatel 
650 0 7 |a transmisní elektronová mikroskopie  |2 czenas  |7 ph563328 
650 0 7 |a nanostruktury  |2 czenas  |7 ph451017 
650 0 7 |a nanotechnologie  |2 czenas  |7 ph123164 
650 0 7 |a nanochemie  |2 czenas  |7 ph502994 
650 0 9 |a transmission electron microscopy  |2 eczenas 
650 0 9 |a nanostructures  |2 eczenas 
650 0 9 |a nanotechnology  |2 eczenas 
650 0 9 |a nanochemistry  |2 eczenas 
655 7 |a elektronické knihy  |7 fd186907  |2 czenas 
655 7 |a monografie  |7 fd132842  |2 czenas 
655 9 |a electronic books  |2 eczenas 
655 9 |a monographs  |2 eczenas 
700 1 |a Spence, John C.H.  |e author. 
710 2 |a SpringerLink (Online service) 
776 0 8 |i Printed edition:  |z 9781493966059 
856 4 0 |u https://proxy.k.utb.cz/login?url=http://dx.doi.org/10.1007/978-1-4939-6607-3  |y Plný text 
942 |2 udc 
992 |c NTK-SpringerCHEMS 

Similar Items