Advanced Transmission Electron Microscopy : Imaging and Diffraction in Nanoscience

This volume expands and updates the coverage in the authors' classic 1992 book, "Electron Microdiffraction." As the title implies, the focus of the book has changed from electron microdiffraction, or convergent beam electron diffraction, to electron nanodiffraction and the application...

Full description

Saved in:
Bibliographic Details
Main Authors Zuo, Jian Min (Author), Spence, John C.H (Author)
Corporate Author SpringerLink (Online service)
Format Electronic eBook
LanguageEnglish
Published New York, NY : Springer New York : Imprint: Springer, 2017.
Subjects
Online AccessFull text
ISBN9781493966073
DOI10.1007/978-1-4939-6607-3
Physical Description1 online resource (XXVI, 729 p. 310 illus., 218 illus. in color.)

Cover

More Information
Summary:This volume expands and updates the coverage in the authors' classic 1992 book, "Electron Microdiffraction." As the title implies, the focus of the book has changed from electron microdiffraction, or convergent beam electron diffraction, to electron nanodiffraction and the applications of electron diffraction from single crystals as well as general structure analysis of single crystals, powders, and nanostructures. Advanced Transmission Electron Microscopy provides a comprehensive treatment of theory and practice, and is written at a level suitable for advanced undergraduate students and graduate students and researchers in materials science, chemistry, and physics. Practical guides are provided for interpretation and simulation of electron diffraction patterns.- Resumé vydavatel
ISBN:9781493966073
Access:Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty
DOI:10.1007/978-1-4939-6607-3
Physical Description:1 online resource (XXVI, 729 p. 310 illus., 218 illus. in color.)