Introduction to quantum metrology : the revised SI system and quantum standards

• Main Author: Nawrocki, Waldemar (Author)
• Format: Book
• Language: English
• Published: Cham : Springer, 2019
• Edition: Second edition
• Subjects: metrologie; mezinárodní soustava jednotek SI; metrology; international metric system; monografie; monographs
• ISBN: 978-3-030-19679-0
• Physical Description: xiv, 326 stran : ilustrace ; 24 cm