Introduction to quantum metrology : the revised SI system and quantum standards
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| Main Author | |
|---|---|
| Format | Book |
| Language | English |
| Published |
Cham :
Springer,
2019
|
| Edition | Second edition |
| Subjects | |
| ISBN | 978-3-030-19679-0 |
| Physical Description | xiv, 326 stran : ilustrace ; 24 cm |
| Bibliography: | Obsahuje bibliografii a rejstřík |
|---|---|
| ISBN: | 978-3-030-19679-0 |
| Physical Description: | xiv, 326 stran : ilustrace ; 24 cm |