Introduction to quantum metrology : the revised SI system and quantum standards

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Bibliographic Details
Main Author: Nawrocki, Waldemar (Author)
Format: Book
Language: English
Published: Cham : Springer, 2019
Edition: Second edition
Subjects:
ISBN: 978-3-030-19679-0
Physical Description: xiv, 326 stran : ilustrace ; 24 cm

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Bibliography: Obsahuje bibliografii a rejstřík
ISBN: 978-3-030-19679-0