Method and apparatus for testing driver circuits of AMOLED
A method and an apparatus for testing a plurality of driver circuits of an AMOLED before OLEDs are implanted are provided. The method and the apparatus select one specific driver circuit to be tested and dispose a conductive board above the array glass of the OLED to form a capacitor. By using the d...
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| Main Authors | , , |
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| Format | Patent |
| Language | English |
| Published |
14.10.2004
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| Online Access | Get full text |
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| Abstract | A method and an apparatus for testing a plurality of driver circuits of an AMOLED before OLEDs are implanted are provided. The method and the apparatus select one specific driver circuit to be tested and dispose a conductive board above the array glass of the OLED to form a capacitor. By using the data line, the scan line, and the power line of an AMOLED, the present invention is able to input and retrieve signals from driver circuits for analyzing each of them is normal or not. |
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| AbstractList | A method and an apparatus for testing a plurality of driver circuits of an AMOLED before OLEDs are implanted are provided. The method and the apparatus select one specific driver circuit to be tested and dispose a conductive board above the array glass of the OLED to form a capacitor. By using the data line, the scan line, and the power line of an AMOLED, the present invention is able to input and retrieve signals from driver circuits for analyzing each of them is normal or not. |
| Author | Tsai, Shan-Hung Sun, Ming-Hsien Shih, An |
| Author_xml | – sequence: 1 givenname: Shan-Hung surname: Tsai fullname: Tsai, Shan-Hung – sequence: 1 givenname: Ming-Hsien surname: Sun fullname: Sun, Ming-Hsien – sequence: 2 givenname: An surname: Shih fullname: Shih, An |
| BookMark | eNrjYmDJy89L5WSw8k0tychPUUjMA-KCgsSixJLSYoW0_CKFktTiksy8dIWUosyy1CKF5Myi5NLMkmKF_DQFR19_H1cXHgbWtMSc4lReKM3NoOnmGuLsoVtaXJBYkppXUhwPNDEnMzmxJDM_rzjeyMDAxMDIwNDY3MiYFLUA1FQ2_A |
| ContentType | Patent |
| DBID | EFI |
| DatabaseName | USPTO Published Applications |
| DatabaseTitleList | |
| Database_xml | – sequence: 1 dbid: EFI name: USPTO Published Applications url: http://www.uspto.gov/patft/index.html sourceTypes: Open Access Repository |
| DeliveryMethod | fulltext_linktorsrc |
| ExternalDocumentID | 20040201372 |
| GroupedDBID | EFI |
| ID | FETCH-uspatents_applications_200402013723 |
| IEDL.DBID | EFI |
| IngestDate | Tue Mar 07 03:42:20 EST 2023 |
| IsOpenAccess | true |
| IsPeerReviewed | false |
| IsScholarly | false |
| Language | English |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-uspatents_applications_200402013723 |
| OpenAccessLink | https://patentcenter.uspto.gov/applications/10822750 |
| ParticipantIDs | uspatents_applications_20040201372 |
| PublicationCentury | 2000 |
| PublicationDate | 20041014 |
| PublicationDateYYYYMMDD | 2004-10-14 |
| PublicationDate_xml | – month: 10 year: 2004 text: 20041014 day: 14 |
| PublicationDecade | 2000 |
| PublicationYear | 2004 |
| Score | 2.569013 |
| Snippet | A method and an apparatus for testing a plurality of driver circuits of an AMOLED before OLEDs are implanted are provided. The method and the apparatus select... |
| SourceID | uspatents |
| SourceType | Open Access Repository |
| Title | Method and apparatus for testing driver circuits of AMOLED |
| URI | https://patentcenter.uspto.gov/applications/10822750 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LS8QwEB50EdSTouKbIF48RJrNo9WbaMsqVj0o7E3SdCp76S5t-v-dRJH1pNcwmYQwZOZjZr4BOKefr7ZVo7kxteVKWeRX2jU8E9alWa0zE7Pn5ZOZvKmHqZ5-N4WFXpgFRVitD4WJ2F0O_cLPY3Xlr2yuCCzlaQDqq5kOVp0X95uwTtJxc7_kIIotWHuJq9uwgu0OXJdxMDMjmM5IaaDXHnpG8SHzgdWi_WB1FwoimJt1bpj5ns0bdlM-P-Z3u3BR5K-3E_5z0PvytcJAxwDGhEzHcg9GhN5xH5hFCnESYdEZqZTWlSNIiIgukWOspTuAs7_1Hf5H6Ag2vlgIEy7UMYx8N-AJeUxfncYn-gR6YnYf |
| linkProvider | USPTO |
| linkToPdf | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LS8QwEB5kFR8nRcW3Qbx4iLY2yVZv4m7Z1e3ag8LeSpqksqBt6QP_vtNUpDe9hjAZMszMN8zkC8AlRj4tk5RTIbSkjElD77hKqe9KNfQ194XtnodzMXljTwu--Hkebd_CfKIb0QJ1qa6bqqhzO1yJ4b0zPO3In1uOwKxlH_jKPnKpI53etNZG6ON6QwzIqwL9xsLIYLoFGygIgVtWV73UEWzDWmRXd2DFZLtwH9ovmwkW8EQWlni7qQgiR1K3fBfZO9FlOypB1LJUzbKuSJ6Sh_BlNh7twVUwfn2c0N-D4n77Oe7p5u3DAOt6cwBEGgQ_jiuNEh5jnCcKi0VjjHK8W6M9dQgXf8s7-s-mc1iPRkE8m86fj2Gzoyp0qMtOYFCXjTnFtFonZ_a2vgEfe4Fj |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Method+and+apparatus+for+testing+driver+circuits+of+AMOLED&rft.inventor=Tsai%2C+Shan-Hung&rft.inventor=Sun%2C+Ming-Hsien&rft.inventor=Shih%2C+An&rft.date=2004-10-14&rft.externalDBID=n%2Fa&rft.externalDocID=20040201372 |