Data-dependent jitter (DDJ) calibration methodology

The present subject matter relates to methodologies for providing error correction compensation to measurement systems. Data-dependant jitter may be compensated by examining both short-term and long-term bit histories after applying a predetermined synthesized calibration pattern having selected cha...

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Bibliographic Details
Main Authors FARAHMAND TOURAJ, TABATABAEI SASSAN
Format Patent
LanguageEnglish
Published 16.01.2007
Subjects
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SELECTING
TESTING
TRANSMISSION
TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION
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Summary:The present subject matter relates to methodologies for providing error correction compensation to measurement systems. Data-dependant jitter may be compensated by examining both short-term and long-term bit histories after applying a predetermined synthesized calibration pattern having selected characteristics to the measurement system. Neural networks may be provided to produce error correction signals that may be applied to measured data on a bit-by-bit basis to correct jitter. The synthesized calibration sequence may correspond to a base pattern having two segments; a first segment may correspond to a copy of the base pattern while the second segment may be a copy of the base pattern with some sections inverted.
Bibliography:Application Number: US20050269146