一种用于LIBS光谱的基线校正方法及相关设备
本发明涉及数据处理领域，公开了一种用于LIBS光谱的基线校正方法及相关设备，该方法包括采集等离子体上所发射的光谱；基于所采集的光谱建立光谱基线动态漂移模型；获取所采集光谱的物理参数，将物理参数输入至光谱基线动态漂移模型内输出得到实时基线偏移量；获取煤种基线模板，提取所采集光谱的连续背景强度，基于连续背景强度计算得到与所获取的煤种基线模板的余弦相似度，当余弦相似度大于对应煤种基线模板的条件阈值时，所述余弦相似度结合实时基线偏移量生成最终校正后的基线。本发明能够更准确地反映环境因素对光谱基线的影响，从而提高校正的精度。...
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| Format | Patent |
|---|---|
| Language | Chinese |
| Published |
05.09.2025
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| Subjects | |
| Online Access | Get full text |
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| Abstract | 本发明涉及数据处理领域，公开了一种用于LIBS光谱的基线校正方法及相关设备，该方法包括采集等离子体上所发射的光谱；基于所采集的光谱建立光谱基线动态漂移模型；获取所采集光谱的物理参数，将物理参数输入至光谱基线动态漂移模型内输出得到实时基线偏移量；获取煤种基线模板，提取所采集光谱的连续背景强度，基于连续背景强度计算得到与所获取的煤种基线模板的余弦相似度，当余弦相似度大于对应煤种基线模板的条件阈值时，所述余弦相似度结合实时基线偏移量生成最终校正后的基线。本发明能够更准确地反映环境因素对光谱基线的影响，从而提高校正的精度。 |
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| AbstractList | 本发明涉及数据处理领域，公开了一种用于LIBS光谱的基线校正方法及相关设备，该方法包括采集等离子体上所发射的光谱；基于所采集的光谱建立光谱基线动态漂移模型；获取所采集光谱的物理参数，将物理参数输入至光谱基线动态漂移模型内输出得到实时基线偏移量；获取煤种基线模板，提取所采集光谱的连续背景强度，基于连续背景强度计算得到与所获取的煤种基线模板的余弦相似度，当余弦相似度大于对应煤种基线模板的条件阈值时，所述余弦相似度结合实时基线偏移量生成最终校正后的基线。本发明能够更准确地反映环境因素对光谱基线的影响，从而提高校正的精度。 |
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| Snippet | 本发明涉及数据处理领域，公开了一种用于LIBS光谱的基线校正方法及相关设备，该方法包括采集等离子体上所发射的光谱；基于所采集的光谱建立光谱基线动态漂移模型；获取所... |
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| Title | 一种用于LIBS光谱的基线校正方法及相关设备 |
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