Multi-channel spatial resolution bent crystal spectrometer and adjustment method thereof

• Main Authors: YI SHENGZHEN, WANG ZHANSHAN, DU HUIYAO
• Format: Patent
• Language: Chinese; English
• Published: 30.05.2023
• Subjects: ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; MEASUREMENT OF NUCLEAR OR X-RADIATION; MEASURING; PHYSICS; PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OFNEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMICBEAMS; TESTING

The invention relates to a multichannel spatial resolution bent crystal spectrometer and an adjustment method thereof, and the adjustment method comprises a plasma X-ray radiation source positioning process, and specifically comprises the following steps: S1, taking a positioning object point irradiated by visible laser as a simulated plasma X-ray radiation source, and adjusting a multichannel bent crystal device to a visible laser reflection light path, adjusting the framing camera to the image surface position of the multi-channel bent crystal device; s2, determining the relative position of the positioning object point relative to the multi-channel bent crystal device through a multi-optical-path aiming lens, wherein the multi-optical-path aiming lens is fixedly arranged relative to the multi-channel bent crystal device; and S3, replacing the positioning object point with the plasma X-ray radiation source according to the position of the positioning object point determined by the multi-optical-path aiming