Spherical curved crystal spectrometer for electron beam ion trap

• Main Authors: LYU BO, WANG FUDI, BIN BIN, FU JIA, ZHANG HONGMING
• Format: Patent
• Language: Chinese; English
• Published: 04.08.2020
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention discloses a spherical curved crystal spectrometer for an electron beam ion trap. The spherical curved crystal spectrometer comprises a detector, a crystal system, a control display system, a vacuumizing unit, a water cooling system, a valve and an electron beam ion trap EBIT. The detector is connected to the crystal system, the control display system, the vacuumizing unit and the water cooling system, and the crystal system is connected to the electron beam ion trap EBIT through the valve; the crystal system comprises three SiO2 spherical crystals and a crystal turntable; each spherical crystal is placed on a circumference of the crystal turntable at an interval of 120 degrees; the crystal turntable can rotate by 360 degrees; different crystals are selected and diffraction angles of the crystals are changed; and a horizontal moving guide rail is arranged below the crystal turntable and used for moving the turntable and changing a horizontal distance between the sphericalcrystal and an electron b