王垒, 彭雄刚, 张红强, 于润升, 张鹏, 伍海彪, . . . 刘福雁. (2023). 正电子湮没寿命测量中干扰信号对谱仪和测量结果的影响. 核技术, 46(6), 53-59. https://doi.org/10.11889/j.0253-3219.2023.hjs.46.060402
Chicago Style (17th ed.) Citation王垒, et al. "正电子湮没寿命测量中干扰信号对谱仪和测量结果的影响." 核技术 46, no. 6 (2023): 53-59. https://doi.org/10.11889/j.0253-3219.2023.hjs.46.060402.
MLA (9th ed.) Citation王垒, et al. "正电子湮没寿命测量中干扰信号对谱仪和测量结果的影响." 核技术, vol. 46, no. 6, 2023, pp. 53-59, https://doi.org/10.11889/j.0253-3219.2023.hjs.46.060402.
Warning: These citations may not always be 100% accurate.