李昌均, 蔡幸福, 肖明清, 王飞, & 曹晓岩. (2022). 基于AN-EOS模型的高压氚泄漏数值模拟. 核技术, 45(7), 99-106. https://doi.org/10.11889/j.0253-3219.2022.hjs.45.070603
Chicago Style (17th ed.) Citation李昌均, 蔡幸福, 肖明清, 王飞, and 曹晓岩. "基于AN-EOS模型的高压氚泄漏数值模拟." 核技术 45, no. 7 (2022): 99-106. https://doi.org/10.11889/j.0253-3219.2022.hjs.45.070603.
MLA (9th ed.) Citation李昌均, et al. "基于AN-EOS模型的高压氚泄漏数值模拟." 核技术, vol. 45, no. 7, 2022, pp. 99-106, https://doi.org/10.11889/j.0253-3219.2022.hjs.45.070603.
Warning: These citations may not always be 100% accurate.