Modeling and Testing of Faults in TCAMs

This paper proposes novel fault models for ternary content addressable memories (TCAMs) regarding both physical defects and functional fault models. Novel test algorithms which guarantee high fault coverage and small test length for detecting the faults in high density TCAM cell array is also propos...

Full description

Saved in:
Bibliographic Details
Published inSystems Modeling and Simulation: Theory and Applications pp. 521 - 528
Main Authors Lee, Kwang-Jin, Kim, Cheol, Kim, Suki, Cho, Uk-Rae, Byun, Hyun-Guen
Format Book Chapter
LanguageEnglish
Published Berlin, Heidelberg Springer Berlin Heidelberg 2005
SeriesLecture Notes in Computer Science
Subjects
Fault Coverage
Fault Model
Test Algorithm
Test Pattern
Transition Fault
Online AccessGet full text
ISBN3540244778
9783540244776
ISSN0302-9743
1611-3349
DOI10.1007/978-3-540-30585-9_58

Cover

More Information
Summary:This paper proposes novel fault models for ternary content addressable memories (TCAMs) regarding both physical defects and functional fault models. Novel test algorithms which guarantee high fault coverage and small test length for detecting the faults in high density TCAM cell array is also proposed. The proposed TS − − T algorithm is suitable for detecting physical faults with compact test patterns and provides 92% fault coverage with small test length. Also, the proposed TM − − T algorithm makes it possible to detect various bridging faults among adjacent cells of high density CAMs. The test access time is (10 * l * 3 + 3 ) * write time and (12 * l * 3) * compare time in a n word by l bit TCAM.
ISBN:3540244778
9783540244776
ISSN:0302-9743
1611-3349
DOI:10.1007/978-3-540-30585-9_58