王炜, 陈熙仁, 余灯广, & 邵军. (2021). 傅里叶变换红外拉曼光谱检测半导体薄膜下衬底特性. 红外与毫米波学报, 40(1), 50-55. https://doi.org/10.11972/j.issn.1001-9014.2021.01.009
Chicago Style (17th ed.) Citation王炜, 陈熙仁, 余灯广, and 邵军. "傅里叶变换红外拉曼光谱检测半导体薄膜下衬底特性." 红外与毫米波学报 40, no. 1 (2021): 50-55. https://doi.org/10.11972/j.issn.1001-9014.2021.01.009.
MLA (9th ed.) Citation王炜, et al. "傅里叶变换红外拉曼光谱检测半导体薄膜下衬底特性." 红外与毫米波学报, vol. 40, no. 1, 2021, pp. 50-55, https://doi.org/10.11972/j.issn.1001-9014.2021.01.009.
Warning: These citations may not always be 100% accurate.