A Differential Evolution Based Approach to Estimate the Shape and Size of Complex Shaped Anomalies Using EIT Measurements

EIT image reconstruction is an ill-posed problem, the spatial resolution of the estimated conductivity distribution is usually poor and the external voltage measurements are subject to variable noise. Therefore, EIT conductivity estimation cannot be used in the raw form to correctly estimate the sha...

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Bibliographic Details
Published inGrid and Distributed Computing, Control and Automation Vol. 121; pp. 206 - 215
Main Authors Rashid, Ahmar, Khambampati, Anil Kumar, Kim, Bong Seok, Liu, Dong, Kim, Sin, Kim, Kyung Youn
Format Book Chapter
LanguageEnglish
Published Germany Springer Berlin / Heidelberg 2010
Springer Berlin Heidelberg
SeriesCommunications in Computer and Information Science
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ISBN3642176240
9783642176241
ISSN1865-0929
1865-0937
DOI10.1007/978-3-642-17625-8_21

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Summary:EIT image reconstruction is an ill-posed problem, the spatial resolution of the estimated conductivity distribution is usually poor and the external voltage measurements are subject to variable noise. Therefore, EIT conductivity estimation cannot be used in the raw form to correctly estimate the shape and size of complex shaped regional anomalies. An efficient algorithm employing a shape based estimation scheme is needed. The performance of traditional inverse algorithms, such as the Newton Raphson method, used for this purpose is below par and depends upon the initial guess and the gradient of the cost functional. This paper presents the application of differential evolution (DE) algorithm to estimate complex shaped region boundaries, expressed as coefficients of truncated Fourier series, using EIT. DE is a simple yet powerful population-based, heuristic algorithm with the desired features to solve global optimization problems under realistic conditions. The performance of the algorithm has been tested through numerical simulations, comparing its results with that of the traditional modified Newton Raphson (mNR) method.
ISBN:3642176240
9783642176241
ISSN:1865-0929
1865-0937
DOI:10.1007/978-3-642-17625-8_21