ケルビンプローブフォース顕微鏡による有機薄膜トランジスタの局所電位評価
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| Published in | Journal of the Vacuum Society of Japan Vol. 60; no. 10; pp. 392 - 396 |
|---|---|
| Main Authors | , |
| Format | Journal Article |
| Language | Japanese |
| Published |
一般社団法人 日本真空学会
2017
|
| Online Access | Get full text |
| ISSN | 1882-2398 1882-4749 |
| DOI | 10.3131/jvsj2.60.392 |
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| Author | 小林, 圭 山田, 啓文 |
|---|---|
| Author_xml | – sequence: 1 fullname: 小林, 圭 organization: 京都大学工学研究科 – sequence: 1 fullname: 山田, 啓文 organization: 京都大学工学研究科 |
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| References_xml | – reference: 19) L. Burgi, H. Sirringhaus and R. H. Friend: Appl. Phys. Lett., 80 (2002) 2913. – reference: 25) M. Ando, S. Heike, M. Kawasaki and T. Hashizume: Appl. Phys. Lett., 105 (2014) 193303. – reference: 23) M. Nakamura, N. Goto, N. Ohashi, M. Sakai and K. Kudo: Appl. Phys. Lett., 86 (2005) 122112. – reference: 2) J. H. Burroughes, C. A. Jones and R. H. Friend: Nature, 335 (1998) 137. – reference: 20) K. P. Puntambekar, P. V. Pesavento and C. D. Frisbie: Appl. Phys. Lett., 83 (2003) 5539. – reference: 10) Lord Kelvin: Philos. Mag., 46 (1898) 82. – reference: 12) H. Sugimura, Y. Ishida, K. Hayashi and O. Takai: Appl. Phys. Lett., 80 (2002) 1459. – reference: 1) A. Tsumura, H. Koezuka and T. Ando: Appl. Phys. Lett., 49 (1986) 1210. – reference: 3) G. Horowitz, D. Fichou, X. Peng, Z. Xu and F. Garnier: Solid State Commun., 72 (1989) 381. – reference: 8) J. M. R. Weaver and D. W. Abraham: J. Vac. Sci. Technol. B, 9 (1991) 1559. – reference: 26) Y. Yamagishi, K. Kobayashi, K. Noda and H. Yamada: Appl. Phys. Lett., 108 (2016) 093302. – reference: 9) M. Nonnenmacher, M. P. O'Boyle and H. K. Wickramasingh: Appl. Phys. Lett., 58 (1991) 2921. – reference: 22) V. Palermo, M. Palma and P. Samorial: Adv. Mater., 18 (2006) 145. – reference: 7) M. Kaltenbrunner, T. Sekitani, J. Reeder, T. Yokota, K. Kuribara, T. Tokuhara, M. Drack, R. Schwodiauer, I. Graz, S. Bauer-Gogonea, S. Bauer and T. Someya: Nature, 499 (2013) 458. – reference: 14) A. Kikukawa, S. Hosaka and R. Imura: Appl. Phys. Lett., 66 (1995) 3510. – reference: 4) C. Reese, M. Roberts, M.-M. Ling, Z. Bao: Mater. Today, 7 (2004) 20. – reference: 24) Y. Yamagishi, K. Noda, K. Kobayashi and H. Yamada: J. Phys. Chem. C, 119 (2015) 3006. – reference: 21) T. Miyazaki, K. Kobayashi, K. Ishida, S. Hotta, T. Horiuchi, K. Matsushige and H. Yamada: J. Appl. Phys., 97 (2005) 124503. – reference: 5) H. Klauk: Chem. Soc. Rev., 39 (2010) 2643. – reference: 6) H. Minemawari, T. Yamada, H. Matsui, J. Tsutsumi, S. Haas, R. Chiba, R. Kumai and T. Hasegawa: Nature, 475 (2011) 364. – reference: 17) F. J. Giessibl: Phys. Rev. B, 56 (1997) 16010. – reference: 27) T. Yamamoto and K. Takimiya: J. Am. Chem. Soc., 129 (2007) 2224. – reference: 16) S. Hudlet, M. S. Jean, C. Guthmann and J. Berger: Eur. Phys. J. B, 2 (1998) 5. – reference: 11) W. A. Zisman: Rev. Sci. Instrum., 3 (1932) 367. – reference: 15) S. Kitamura and M. Iwatsuki: Appl. Phys. Lett., 72 (1998) 3154. – reference: 13) T. R. Albrecht, P. Grutter, D. Horne and D. Rugar: J. Appl. Phys., 69 (1991) 668. – reference: 18) U. Zerweck, C. Loppacher, T. Otto, S. Grafstrom and L. M. Eng: Phys. Rev. B, 71 (2005) 125424. |
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| Title | ケルビンプローブフォース顕微鏡による有機薄膜トランジスタの局所電位評価 |
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