Invited: Enhancing Test Quality by Targeting Timing Marginalities Due to Process Variations - Singh, Adit D.; Faridi, Mukarram Ali (2025 62nd ACM/IEEE Design Automation Conference (DAC), 2025)
Keywords: Circuit Simulation; Delays; Digital circuits; Integrated circuit modeling; Integrated circuit reliability; Nonlinear circuits; Path Delay Testing; Performance evaluation; Random processes; Silent Error Corruption; Testing; Threshold voltage; Timing Failures; Transistors