APA (7th ed.) Citation

Singh, A. D., & Faridi, M. A. (2025, June 22). Invited: Enhancing Test Quality by Targeting Timing Marginalities Due to Process Variations. 2025 62nd ACM/IEEE Design Automation Conference (DAC), 1-4. https://doi.org/10.1109/DAC63849.2025.11132918

Chicago Style (17th ed.) Citation

Singh, Adit D., and Mukarram Ali Faridi. "Invited: Enhancing Test Quality by Targeting Timing Marginalities Due to Process Variations." 2025 62nd ACM/IEEE Design Automation Conference (DAC) 22 Jun. 2025: 1-4. https://doi.org/10.1109/DAC63849.2025.11132918.

MLA (9th ed.) Citation

Singh, Adit D., and Mukarram Ali Faridi. "Invited: Enhancing Test Quality by Targeting Timing Marginalities Due to Process Variations." 2025 62nd ACM/IEEE Design Automation Conference (DAC), 22 Jun. 2025, pp. 1-4, https://doi.org/10.1109/DAC63849.2025.11132918.