Intelligent Feedback Analytics- Sentiment Analysis and Defect Detection in Elevating Product Quality and Customer Experience - Padoor, Veda; P, Tharun Kumar; Pani, Y L Krishna; Bhalke, Vaibhavi; Kasturi, Nivedita (Communications and Signal Processing, International Conference on, 2025)
Keywords: Accuracy; BERT Multilingual Model; Defect Prioritization; Feature extraction; OpenAI Whisper; Organizations; Product design; Quality assessment; Sentiment analysis; Signal processing; spaCy; Systematics; Technological innovation; Text analysis; Zero Shot Classification