Short Paper: Bus-based Packetized Scan Architecture Trade-offs for Heterogeneous Multi-Core SoCs - Iwata, Hiroyuki; AbdAlwahab, Mahmoud; Press, Ron; Sugiura, Ohki (Proceedings - International Test Conference, 2024)
Keywords: Business; Data transfer; datapath; DfT architecture; industrial test; multi-core; packetized scan; Physical design; skew; SSN; test time