Multi-Modal Instrument Recognition Method Based on Improved YOLOv5s and ESPNet - Shen, Shixian; Wang, Jianguo; Feng, Yong; Li, Yingna (IEEE International Conference on Power, Intelligent Computing and Systems (Online), 2024)
Keywords: Accuracy; Analytical models; Anomaly detection; Data models; digital twin; dynamic non-monotonic focus mechanism; ESPNet; Focusing; Image segmentation; Industries; Instruments; Monitoring; pointer-type instrument; YOLO